Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA | 東京工業大学附属図書館蔵書検索

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Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA / sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]

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図書

出版情報:

Los Alamitos, Calif. : IEEE Computer Society Press, c1998

形態:

ix, 131 p. ; 28 cm

著者名:

ISBN:

9780818684944 [0818684941]

書誌ID:

BA43731238

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書誌詳細

その他の標題:	98TB100236 Memory Technology, Design and Testing MTDT'98
注記:	"IEEE Order Plan Catalog Number 98TB100236"--T.p. verso "IEEE Computer Society Order Number PR08494"--T.p. verso Includes bibliographical references and index
主題:	Random access memory--Congresses; Semiconductor storage devices--Testing--Congresses
言語:	英語

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