>> Google Books
所蔵情報QRコード

X-ray and ultraviolet spectroscopy and polarimetry II : 23-24 July 1998, San Diego, California / Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1998
形態:
v, 160 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3443 <BA0022700X>
著者名:
ISBN:
9780819428981 [0819428981]
書誌ID:
BA44159971
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information

類似資料:

Fineschi, Silvano, Woodgate, Bruce, Kimble, Randy Alan, Society of Photo-optical Instrumentation Engineers

SPIE

Fineschi, Silvano, Society of Photo-optical Instrumentation Engineers.

SPIE Digital Library Proceedings

Siegmund, Oswald H. W., Rothschild, Richard E., 1943-, Society of Photo-optical Instrumentation Engineers

SPIE

Mott, Harold, Boerner, Wolfgang M., 1937-, Society of Photo-optical Instrumentation Engineers

SPIE

Siegmund, Oswald H. W., Society of Photo-optical Instrumentation Engineers

SPIE

Fineschi, Silvano, Society of Photo-optical Instrumentation Engineers.

SPIE Digital Library Proceedings

Siegmund, Oswald H. W., Society of Photo-optical Instrumentation Engineers

SPIE

Siegmund, Oswald H. W., Gummin, Mark A., Society of Photo-optical Instrumentation Engineers, North American Remote …

SPIE

Siegmund, Oswald H. W., Hudson, Hugh S., Society of Photo-optical Instrumentation Engineers

SPIE

Golub, L. (Leon), Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics …

SPIE-- the international Society for Optical Engineering

Fineschi, Silvano, Society of Photo-optical Instrumentation Engineers.

SPIE Digital Library Proceedings

Citterio, Oberto, O'Dell, Stephen L. (Stephen Lynn)

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12