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Impact of electron and scanning probe microscopy on materials research / edited by David G. Rickerby, Giovanni Valdrè and Ugo Valdrè

資料種別:
図書
出版情報:
Dordrecht ; Boston : Kluwer Academic, c1999
形態:
xxiv, 489 p. ; 24 cm
シリーズ名:
NATO ASI series ; Series E, Applied sciences ; v. 364 <BA00020624>
著者名:
ISBN:
9780792359395 [0792359399]
9780792359401 [0792359402] (: pbk)
書誌ID:
BA44512400
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