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1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Central Texas Section

資料種別:
図書
出版情報:
Piscataway, NJ : IEEE Service Center, c1999
形態:
xxix, 830 p. ; 28 cm
著者名:
ISBN:
9780780354326 [078035432X] (: soft.)
9780780354333 [0780354338] (: case.)
書誌ID:
BA45434437
子書誌情報
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