1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium

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1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Central Texas Section

資料種別:

図書

出版情報:

Piscataway, NJ : IEEE Service Center, c1999

形態:

xxix, 830 p. ; 28 cm

著者名:

ISBN:

9780780354326 [078035432X] (: soft.)
9780780354333 [0780354338] (: case.)

書誌ID:

BA45434437

子書誌情報

フルテキスト

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他の版・巻

書誌詳細

その他の標題:	1999 IEEE AUTOTESTCON AUTOTESTCON 99 99CH36323
ISSN:	10887725
注記:	"IEEE catalog no. 99CH36323"
主題:	Automatic checkout equipment--Congresses; Electronics in aeronatics--Congresses; Maintainabillty (Engineering)--Congresses
言語:	英語

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