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Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China / Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Washington : SPIE, c1998
形態:
xiii, 656 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3558 <BA0022700X>
著者名:
ISBN:
9780819430199 [0819430196]
書誌ID:
BA45606215
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