Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico

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Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico / sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

資料種別:

図書

出版情報:

Los Alamitos, CA. ; Tokyo : IEEE Computer Society, c1998

形態:

xiii, 405 p. ; 23 cm

著者名:

ISBN:

9780769503257 [076950325X]
9780769503271 [0769503276] (: microfiche)

書誌ID:

BA45729951

子書誌情報

フルテキスト

所蔵情報

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書誌詳細

その他の標題:	1999 proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Proceedings : The IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems PR00325
ISSN:	10636722
注記:	Includes bibliographical references and index "Sponsored by ..., The IEEE Computer Society Test Technology Technical Committee" -- cover "IEEE Computer Society Press order number PR00325" "IEEE order plan catalog number PR00325"
言語:	英語

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