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1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 / sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

資料種別:
図書
出版情報:
Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, c1998
形態:
vi, 140 p. ; 28 cm
著者名:
ISBN:
9780780348813 [0780348818] (:softbound)
書誌ID:
BA48553024
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