Volumes in Series |
Preface |
Introduction / 1.: |
References |
Statistical Nature of Rough Surfaces / 2.: |
First-Order Statistics: Surface Height Distribution Function and Characteristic Function / 2.1: |
Second-Order Statistics: Auto-Correlation Function, Height-Height Correlation Function, and Power Spectrum / 2.2: |
Other Statistical Properties of a Random Rough Surface / 2.3: |
Numerical Estimation of the Roughness Parameters / 2.4: |
Summary / 2.5: |
Examples of Random Rough Surfaces / 3.: |
Self-Affine Surfaces / 3.1: |
Mounded Surfaces / 3.2: |
Anisotropic Surfaces / 3.3: |
Dynamics of Random Rough Surface Formation / 3.4: |
Generating Rough Surfaces / 3.5: |
Real-Space Surface Profiling Techniques / 3.6: |
Scanning Techniques / 4.1: |
Imaging Techniques / 4.2: |
Effects of Finite Tip and Sample Sizes / 4.3: |
Finite Tip Size Effects in SPM Measurements / 5.1: |
Finite Sampling Size Effect in Image Analysis / 5.2: |
Diffraction Techniques--Fundamentals / 5.3: |
Scattering and Diffraction Concepts / 6.1: |
Multi-Atom Diffraction / 6.2: |
Diffraction from Rough Surfaces--General Formula / 6.3: |
Diffraction from Rough Surfaces--Continuum Theory / 6.4: |
Diffraction from Random Rough Surfaces / 6.5: |
General Properties of Diffraction Profiles / 7.1: |
Diffraction from a Gaussian Rough Surface / 7.2: |
Diffraction from Multi-Step Surfaces in 2+1 Dimensions / 7.3: |
Diffraction Techniques--Experimentation / 7.4: |
The Diffraction Geometries / 8.1: |
The Measured Diffraction Intensity Profile / 8.2: |
Practical Issues in Diffraction Measurement / 8.3: |
Self-Affine Fractal Surfaces / 8.4: |
Real-Space Characteristics / 9.1: |
Diffraction from an Isotropic Self-Affine Gaussian Surface / 9.2: |
An Example: The Backside of Silicon Wafers / 9.3: |
Diffraction from Discrete Self-Affine Surfaces / 9.4: |
Diffraction from Mounded Surfaces / 9.5: |
Diffraction from Discrete Mounded Surfaces / 10.3: |
Examples / 10.4: |
Diffraction from Anisotropic Surfaces / 10.5: |
An Example: The Hard-Disk Surface / 11.3: |
Non-Gaussian Surfaces / 11.4: |
Height Difference Distribution P(z, r) and Height Difference Function C(k[perpendicular, bottom], r) / 12.1: |
Diffraction Structure Factors from Non-Gaussian Surfaces / 12.2: |
Two-Dimensional Fractal Surfaces / 12.3: |
A Discrete Two-Level Surface / 13.1: |
Special Cases for Discrete Two-Level Surfaces / 13.2: |
Continuous Two-Level Surfaces / 13.3: |
Determination of Roughness Parameters / 13.4: |
Transition to Multilayer Structures / 13.5: |
Intensity Oscillations / 14.1: |
Diffraction from Dynamic Roughening Fronts / 14.2: |
Transmission Diffraction and Fractals / 14.3: |
Transmission Diffraction Geometry / 15.1: |
Three-Dimensional Fractal Structures / 15.2: |
Diffraction Characteristics / 15.3: |
Effects of Surface Roughness: Examples / 16.: |
Local Slope, Surface Area, and Surface Energy / 16.1: |
Effect of Surface/Interface Roughness on Electrical Properties of Thin Films / 16.2: |
Effect of Surface/Interface Roughness on Magnetic Properties of Thin Films / 16.3: |
Effect of Surface/Interface Roughness on Electronic Device Operations / 16.4: |
Growth Dynamics / 16.5: |
Time Evolution of the Interface Width in the Edwards-Wilkinson Equation / Appendix B.: |
Effect of Different Functional Forms of the Scaling Function on the Shape of the Diffraction Profile / Appendix C.: |
Joint Distributions of Random Processes with Non-Gaussian Height Distributions / Appendix D.: |
Height Difference Function C(k[perpendicular, bottom], r) for Different Height Distributions / Appendix E.: |
A Perturbative Solution of Sine-Gorden Equation / Appendix F.: |
Speckle / Appendix G.: |
Diffraction of an Ultrafast Radiation Pulse / Appendix H.: |
Index |
Volumes in Series |
Preface |
Introduction / 1.: |
References |
Statistical Nature of Rough Surfaces / 2.: |
First-Order Statistics: Surface Height Distribution Function and Characteristic Function / 2.1: |