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Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

資料種別:
図書
出版情報:
Washington, D.C. : International Test Conference, c2000
形態:
xiv, 1158 p. ; 29 cm
著者名:
ISBN:
9780780365469 [0780365461] (: soft)
9780780365476 [078036547X] (: case)
9780780365483 [0780365488] (: microfiche)
書誌ID:
BA49486625
子書誌情報
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