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Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA / David B. Chenault, Michaek J. Duggin, Walter G. Egan, Dennis H. Goldstein, chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2000
形態:
ix, 302 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4133 <BA0022700X>
著者名:
ISBN:
9780819437785 [0819437786]
書誌ID:
BA49669057
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