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Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA / Winfried M. Kaiser, Richard H. Stulen chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c2000
形態:
vii, 178 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4146 <BA0022700X>
著者名:
ISBN:
9780819437914 [0819437913]
書誌ID:
BA4967505X
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