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Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA / Winfried M. Kaiser, Richard H. Stulen chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE, c2000

形態:

vii, 178 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4146 <BA0022700X>

著者名:

ISBN:

9780819437914 [0819437913]

書誌ID:

BA4967505X

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	X-ray astronomy--Congresses; X-ray optics--Congresses
言語:	英語

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