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2000 5th International Workshop on Statistical Metrology, June 11, 2000, Hawaii / [sponsored by] The IEEE Electron Devices Society

資料種別:
図書
出版情報:
Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2000
形態:
83 p. ; 28 cm
著者名:
ISBN:
9780780358966 [0780358961] (: pbk)
書誌ID:
BA49782060
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