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Defects in SiO[2] and related dielectrics : science and technology / edited by G. Pacchioni, L. Skuja, D. L. Griscom

資料種別:
図書
出版情報:
Dordrecht : Kluwer Academic Publishers, c2000
形態:
viii, 624 p. ; 25 cm
シリーズ名:
NATO science series ; Sub-series II, Mathematics, Physics and Chemistry ; vol. 2 <BA40559140>
著者名:
ISBN:
9780792366850 [0792366859]
9780792366867 [0792366867] (: pbk)
書誌ID:
BA50677121
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