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Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts / chairs/editors: Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman ; sponsored by SPIE - the International Society for Optical Engineering ; endorsed by MVA/SME - Machine Vision Association of the Society of Manufacturing Engineers

資料種別:
図書
出版情報:
Bellingham : SPIE, c1998
形態:
xi, 386 p. ; 28 cm.
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; Vol. 3521 <BA0022700X>
著者名:
ISBN:
9780819429827 [0819429821]
書誌ID:
BA50959622
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