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2000 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 / sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

資料種別:
図書
出版情報:
Piscataeay, N.J. : IEEE Operations Center, c2000
形態:
vii, 199 p. ; 28 cm
著者名:
ISBN:
9780780363922 [0780363922] (: softbound)
書誌ID:
BA5111078X
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