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Proceedings, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October, 2000, Yamanashi, Japan / sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Torerant Systems, IEICE, Japan

資料種別:
図書
出版情報:
Los Alamitos, CA. : IEEE Computer Society, c2000
形態:
xii, 422 p. ; 23 cm
著者名:
ISBN:
9780769507194 [0769507190]
9780769507200 [0769507204] (: case)
書誌ID:
BA51163946
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