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X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California / Silvano Fineschi, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1995
形態:
vii, 284 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2517 <BA0022700X>
著者名:
ISBN:
9780819418760 [0819418765]
書誌ID:
BA51736703
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