Automatic blemish detection in liquid crystal flat panel displays / W.K. Pratt, S.S. Sawkar, K. O'Reilly |
Automated optical inspection technology for HDD head suspension / S. Sakai, H. Oka, M. Ando |
Machine vision system applied to the characterization of a powder stream : application to the laser cladding process / F. Meriaudeau ... [et al.] |
Comparison of several artificial neural network classifiers for CT images of hardwood logs / D.L. Schmoldt, J. He, A.L. Abbott |
Fuzzy logic connectivity in semiconductor defect clustering / T.P. Karnowski, S.S. Gleason, K.W. Tobin, Jr |
New algorithm to calculate the center of laser reflections / D. Yang ... [et al.] |
Development of high-speed 3D inspection system for solder bumps / Y. Nishiyama ... [et al.] |
Detection of small or low-contrast defects in web inspection / J. Laitinen |
Automated detection of Karnal bunt teliospores / K.D. Linder ... [et al.] |
Rule-based inspection of printed green ceramic tape / D.R. Patek ... [et al.] |
Shift-, rotation-, and scale-invariant shape recognition system using an optical Hough transform / V. Schmid, G. Bader, E.H. Lueder |
High-speed optoelectric image processing unit for industrial inspection / G. Cheng .. [et al.] |
Adaption of the fuzzy k-nearest neighbor classifier for manufacturing automation / K.W. Tobin, Jr., S.S. Gleason, T.P. Karnowski |
Representing the object model for automatic visual inspection using a description language / R. Sablatnig, C. Menard |
Optoelectronic morphological processor for industrial online inspection / H. Liu ... [et al.] |
Machine vision system for inner-wall surface inspection / B.H. Zhuang, W.W. Zhang |
Automatic blemish detection in liquid crystal flat panel displays / W.K. Pratt, S.S. Sawkar, K. O'Reilly |
Automated optical inspection technology for HDD head suspension / S. Sakai, H. Oka, M. Ando |
Machine vision system applied to the characterization of a powder stream : application to the laser cladding process / F. Meriaudeau ... [et al.] |
Comparison of several artificial neural network classifiers for CT images of hardwood logs / D.L. Schmoldt, J. He, A.L. Abbott |
Fuzzy logic connectivity in semiconductor defect clustering / T.P. Karnowski, S.S. Gleason, K.W. Tobin, Jr |
New algorithm to calculate the center of laser reflections / D. Yang ... [et al.] |