Blank Cover Image
所蔵情報QRコード

Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000 / editor, Krsto Prelec

資料種別:
図書
出版情報:
Melville, New York : American Institute of Physics, c2001
形態:
xiv, 304 p. ; 25 cm
シリーズ名:
AIP conference proceedings ; no. 572 <BA00284604>
著者名:
ISBN:
9780735400115 [0735400113]
書誌ID:
BA53573519
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

International Symposium on Electron Beam Ion Sources and Traps and their Applications, Prelec, Krsto

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

International Symposium on Electron Beam Ion Sources and Their Applications (1988 : Upton, N.Y.), Hershcovitch, Ady, …

American Institute of Physics

Alessi, James G., Hershcovitch, Ady, American Institute of Physics, International Symposium on the Production and …

American Institute of Physics

Production and Neutralization of Negative Ions and Beams, Production and Application of Light Negative Ions, Prelec, …

AIP Press

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

Prelec, Krsto, American Institute of Physics.

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

Jacquot, Claude, American Institute of Physics.

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

Prelec, Krsto, American Institute of Physics

American Institute of Physics

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

International Symposium on Electron Beam Ion Sources and Their Applications, Hershcovitch, Ady

AIP Conference Proceedings (American Institute of Physics), AIP Publishing

ACM SIGSOFT Symposium on the Foundations of Software Engineering, Association for Computing Machinery. Conference

Association for Computing Machinery, c2000

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12