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Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA / editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2001
形態:
viii, 108 p. ; 28 cm
著者名:
IEEE International Workshop on Memory Technology, Design, and Testing <DA12300318>
Zorian, Yervant
Courtois, B. (Bernard) <DA09741734>
Wik, Thomas
Cockburn, Bruce
IEEE Computer Society <DA00479199>
IEEE Computer Society. Test Technology Technical Council <DA1250352X>
IEEE Computer Society. Technical Committee on VLSI <DA04967445>
IEEE Solid-State Circuits Society <DA13128277>
さらに 4 件
ISBN:
9780769512426 [0769512429]
9780769512433 [0769512437] (: case)
書誌ID:
BA53591736
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