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Proceedings, Microscopy and Microanalysis 1998 : Microscopy Society of America 56th Annual Meeting : Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia, July 12-16, 1998 / edited by G.W. Bailey ... [et al.]

資料種別:
図書
出版情報:
New York : Springer, 1998
形態:
lv, 1194 p. ; 29 cm
シリーズ名:
Microscopy and Microanalysis ; v. 4, suppl. 2 <BA54267493>
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書誌ID:
BA54160547
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