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Scattering and surface roughness III : 1-2 August 2000, San Diego, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2000

形態:

vii, 222 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4100 <BA0022700X>

著者名:

ISBN:

9780819437457 [081943745X]

書誌ID:

BA54588318

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Electromagnetic waves--Scattering Congresses; Light--Scattering Congresses; Surface roughness--Measurement Congresses
言語:	英語

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