International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA | 東京工業大学附属図書館蔵書検索

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International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA / sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

資料種別:

図書

出版情報:

Washington, D.C. : International Test Conference, c2001

形態:

xiv, 1201 p. ; 29 cm

著者名:

ISBN:

9780780371699 [0780371690]

書誌ID:

BA54697324

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書誌詳細

その他の標題:	01CH37260
ISSN:	10893539
注記:	Description from cover "IEEE Catalog Number 01CH37260"--p. ii Includes bibliographical references and index
主題:	Automatic checkout equipment--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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