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Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April 2001, Orlando, USA / Robert Lee Murrer, Jr., chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2001
形態:
x, 530 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4366 <BA0022700X>
著者名:
ISBN:
9780819440617 [0819440612]
書誌ID:
BA55904887
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