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Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California / sponsored by IEEE Computer Society Test Technology Technical Council

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2002
形態:
xxxvii, 452 p. ; 28 cm
著者名:
ISBN:
9780769515700 [0769515703]
書誌ID:
BA5705997X
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