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Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA / Daniel A. Tichenor, James A. Folta, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c2001
形態:
vii, 174 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4506 <BA0022700X>
著者名:
ISBN:
9780819442208 [0819442208]
書誌ID:
BA57601423
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