ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington | 東京工業大学附属図書館蔵書検索

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ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington / sponsored by EDFAS

資料種別:

図書

出版情報:

Materials Park, Ohio : ASM International, c2000

形態:

xxi, 577 p. ; 28 cm + CD-ROM

著者名:

ISBN:

9780871707017 [0871707012]

書誌ID:

BA58199420

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書誌詳細

その他の標題:	ISTFA 2000 : conference proceedings from the 26th International Symposium for Testing and Failure Analysis
注記:	Includes bibliographical references and index EDFAS : Electronic Device Failure Analysis Society
言語:	英語

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