>> Google Books
所蔵情報QRコード

ITherm 2002 : ITherm 2002 is Eighth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems [San Diego, California, USA, May 30-June 1, 2002] / sponsored by the Components, Packaging, and Manufacturing Technology Society of the Institute of Electrical and Electronics Engineers (CPMT/IEEE) ; edited by C. H. Amon ... [et al.]

資料種別:
図書
出版情報:
Piscataway, N.J. : IEEE Service Center, [2002]
形態:
xxviii,1115 p. ; 28 cm
著者名:
ISBN:
9780780371521 [0780371526] (: softbound)
書誌ID:
BA5834371X
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, Components, Packaging & …

IEEE Service Center

InterSociety Conference on Thermal Phenomena in Electronic Systems

Additional copies of this proceedings may be purchased from: IEEE Service Center

InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, Components, Packaging & …

IEEE Service Center

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

InterSociety Conference on Thermal Phenomena in Electronic Systems, American Society of Mechanical Engineers. K-16 …

IEEE Service Center

Amon, Cristina H., International Mechanical Engineering Congress and Exposition, American Society of Mechanical …

American Society of Mechanical Engineers

InterSociety Conference on Thermal Phenomena in Electronic Systems, IEEE Components, Hybrids, and Manufacturing …

Institute of Electrical and Electronics Engineers, IEEE Service Center

InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, Components, Packaging & …

IEEE Service Center

InterSociety Conference on Thermal Phenomena in Electronic Systems, American Society of Mechanical Engineers. K-16 …

Additional copies of this proceedings may be purchased from : IEEE Service Center

IEEE Electronic Library (IEL) Conference Series, IEEE

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12