Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001 / edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore
- 資料種別:
- 図書
- 出版情報:
- Piscataway, NJ : Institute of Electrical and Electronics Engineers, c2001
- 形態:
- 262 p. ; 30 cm
- 著者名:
- ISBN:
- 9780780366756 [0780366751]
- 書誌ID:
- BA59009735
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