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Proceedings of the 2001, 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2001 / edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore

資料種別:
図書
出版情報:
Piscataway, NJ : Institute of Electrical and Electronics Engineers, c2001
形態:
262 p. ; 30 cm
著者名:
International Symposium on the Physical & Failure Analysis of Integrated Circuits <DA1025375X>
Tan, Wilson
IEEE Singapore Section. Reliability/CPMT/EDA Chapter <DA10253782>
IEEE Electron Devices Society <DA01257512>
National University of Singapore. Centre for IC Failure Analysis and Reliability <DA10253793>
Institute of Microelectronics <DA10253807>
さらに 1 件
ISBN:
9780780366756 [0780366751]
書誌ID:
BA59009735
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