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Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada / [sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2002
形態:
xiii, 441 p. ; 23 cm
著者名:
ISBN:
9780769518312 [0769518311]
書誌ID:
BA59271975
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