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International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA / sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section

資料種別:
図書
出版情報:
Washington, D.C. : International Test Conference, c2002
形態:
xvi, 1250 p. ; 29 cm
著者名:
ISBN:
9780780375420 [0780375424]
書誌ID:
BA59306515
子書誌情報
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