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Developments in X-ray tomography II : 22-23 July 1999, Denver, Colorado / Ulrich Bonse, chair/editor ; sponsored and published by SPIE--The International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c1999
形態:
ix, 340 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3772 <BA0022700X>
著者名:
ISBN:
9780819432582 [081943258X]
書誌ID:
BA60509790
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