Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California / Geoffrey T. Burnham...[et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash. : SPIE, c2000
- 形態:
- viii, 320 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3945 <BA0022700X>
- 著者名:
- ISBN:
- 9780819435620 [0819435627]
- 書誌ID:
- BA60692449
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