| Preface |
| Materials Research Society Symposium Proceedings |
| Electrically Inhomogeneous Materials |
| Electrical Characterization of Inhomogeneous and Heterogeneous Systems With Microstructural Periodicity / Joachim Maier |
| Effects of Grain Size Distribution on Cole-Cole Plots of Polycrystalline Spinels / M.P. Gutierrez-Amador ; R. Valenzuela |
| Microstructural Development and Properties of (1-x) wt% Ba[subscript 0.55]Sr[subscript 0.45]TiO[subscript 3]-x wt% MgO Bulk Ferroelectrics / Costas G. Fountzoulas |
| Computer Simulation on the Relations Between the Porosity and the Microwave Properties in Dielectric Ceramics / Jae-Hwan Park ; Jae-Gwan Park ; Yoonho Kim |
| Microstructure and Damage of the Interlaminar Interface of Carbon Fiber Polymer-Matrix Composites, Monitored by Contact Electrical Resistivity Measurement / Shoukai Wang ; Victor H. Guerrero ; Daniel P. Kowalik ; D.D.L. Chung |
| Damage Detectability on Aluminum Alloy Panels Under Composite Patching by Various NDT Techniques / Antonia Moropoulou ; Niki Kouloumbi ; Zaira P. Marioli-Riga ; Nicolas P. Avdelidis ; Paraskevi Pantazopoulou |
| A Percolation Equation for Modeling Experimental Results for Continuum Percolation Systems / D.S. McLachlan ; C. Chiteme ; W.D. Heiss ; Junjie Wu |
| Percolation Properties of Cellular Composite Systems |
| Electrical Conductivity of Ionic and Electronic Mixture / Gyeong Man Choi ; Joon Hee Kim ; Young Min Park |
| AC Conductivity Based Microstructural Characterization of Yttria Stabilized Zirconia / G. Sauti |
| Impedance Spectroscopy Study of Ionic Diffusion in Polycrystalline ZrO[subscript 2]:Y[subscript 2]O[subscript 3] Solid Solution / Fabio C. Fonseca ; Eliana N.S. Muccillo ; R. Muccillo |
| The Influence of Filler Properties on the Strong PTC Effect of Resistivity in Polymer Based Conducting Composites / Joachim Glatz-Reichenbach ; Ralf Strumpler |
| Advances in Experimental Methods and Interpretation |
| Sensitivity and Resolution Limits in Scanning Capacitance Microscopy / Stefan Lanyi ; Miloslav Hruskovic |
| Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images / Sergei V. Kalinin ; Dawn A. Bonnell |
| Magnetic Force Microscopy Signatures of Defects in Current-Carrying Lines / Ruchirej Yongsunthon ; Ellen D. Williams ; Andrei Stanishevsky ; Jonathan McCoy ; Robert Pego ; Philip J. Rous ; Martin Peckerar |
| Displacement Current Staircase Due to Coulomb Blockade / Kouhei Nagano ; Atsushi Okuda ; Yutaka Majima |
| Electromagnetic Waves Through Disordered Systems: Comparison of Intensity, Transmission and Conductance / Fredy R. Zypman ; Gabriel Cwilich |
| Impedance Spectroscopy in Ferromagnetic Materials / Raul Valenzuela |
| Incentives for Using LEIM in the Investigation of Corrosion Initiation on Organic Coated Alloys / S.R. Taylor ; A.M. Mierisch |
| Electrochemical Porosimetry / Hyun-Kon Song ; Kun-Hong Lee |
| The Use of XANES and ELNES for the Characterization of Stabilized Zirconia / David W. McComb ; Sergei Ostanin ; Dimitris Vlachos ; Alan J. Craven ; Michael W. Finnis ; Anthony T. Paxton ; Ali Alavi |
| FT-IR Spectra of Li(Al[subscript x]Co[subscript 1-x])O[subscript 2] (x=0.1-0.5) / W. Hao ; C. Li ; X. Meng ; G. Chen ; W. Xu |
| Microelectronic Applications |
| Investigation of Pt/Si/CeO[subscript 2]/Pt MOS Device Structure by Impedance Spectroscopy / Jyrki Lappalainen ; Darja Kek ; Harry L. Tuller |
| Radio-Frequency Impedance Analysis of Anodic Tantalum Pentoxide Thin Films / S. Duenas ; H. Castan ; J. Barbolla ; R.R. Kola ; P.A. Sullivan |
| Improvement of Characteristics in Highly Reliable Thin Film Diode With Anodic Tantalum Pentoxide by Low Temperature Annealing Conditions / Chan-Jae Lee ; Sung-Jei Hong ; Sung-Kyu Park ; Yong-Hoon Kim ; Min-Gi Kwak ; Won-Keun Kim ; Jeong-In Han |
| Application of a Buffer Layer for the Dielectric Measurement of Thin Polymer Films / C.K. Chiang ; Wataru Sakai |
| Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic / Richard K. Ahrenkiel ; B. Lojek |
| Depth Dependence of Dopant Induced Features on the Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling / Lequn Liu ; Jixin Yu ; Joseph W. Lyding |
| Influence of Substrate Annealing Temperature Upon Deep Levels in n-Type 4H SiC / Martin E. Kordesch ; Florentina Perjeru ; R.L. Woodin |
| Charge-Based Deep Level Transient Spectroscopy of Semiconducting and Insulating Materials / V.I. Polyakov ; A.I. Rukovishnokov ; N.M. Rossukanyi ; B. Druz |
| Determination of Surface Space Charge Density on Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Probe / Tomohiko Masuda ; Setsuri Uehara ; Mitsumasa Iwamoto |
| Conductance-Transient Three-Dimensional Profiling of Disordered Induced Gap States on Metal-Insulator-Semiconductor Structures / I. Martil ; G. Gonzalez-Diaz |
| Electrically Active Deep Levels in ScN / Xuewen Bai |
| Materials Characterization and Device Performance of a CMR-Ferroelectric Heterostructure / S.R. Surthi ; S. Kotru ; R.K. Pandey |
| Microwave Transient Photoconductivity Studies in Porous Semiconductors / Horia-Eugen Porteanu ; Elisaveta Konstantinova ; Vladimir Kytin ; Oleg Loginenko ; Victor Timoshenko ; Thomas Dittrich ; Frederick Koch |
| Improving GaAs Chip Yield and Enhancing Reliability of GaAs Devices / Kanti Prasad |
| Capacitance Spectroscopy of n-i-n and p-i-p GaAs Sandwich Structures With Nanoscale as Clusters in the i-Layers / V.V. Chaldyshev ; P.N. Brunkov ; A.V. Chernigovskii ; A. Moskalenko ; N.A Bert ; S.G. Konnikov ; V.V. Preobrazhenskii ; M.A. Putyato ; B.R. Semyagin |
| Metals and Alloys |
| Scaling Effects in Al[subscript 72]Mn[subscript 22]Si[subscript 6] Quasicrystals Deduced From the Pressure and Temperature Dependence of the Resistance / John K. Vassiliou ; Jens W. Otto ; A. Pothireddy ; E.A. Simons |
| An Ab Initio Investigation on the Effects of Impurity in Aluminum Grain Boundary / Guang-Hong Lu ; Tomoyuki Tamura ; Masao Kamiko ; Masanori Kohyama ; Ryoichi Yamamoto |
| Effect of Grain Boundaries and Indentation Load on the Electrical Properties of Nickel Base Super-Alloys / Kimberly Pinkos ; Celestina Laboy ; Rosario A. Gerhardt |
| Phase Transformation Hysteresis in a Plutonium Alloy System: Modeling the Resistivity During the Transformation / Jeffery J. Haslam ; Mark A. Wall ; David L. Johnson ; David J. Mayhall ; Adam J. Schwartz |
| Detection of Compositional Fluctuations in High Temperature Exposed Waspaloy / Xiaodong Zou ; Tariq Makram |
| Refractory Thin-Film Metallizations With Controlled Stress and Electrical Resistivity / Ilan Golecki ; Margaret Eagan |
| Surface Roughness and Surface-Induced Resistivity of Thin Gold Films on Mica / Raul C. Munoz ; German Kremer ; Luis Moraga ; Guillermo Vidal ; Claudio Arenas |
| Amorphous Materials |
| Influence of Confinement on Molecular Reorientational Dynamics of Liquid Crystals: Broadband Dielectric Spectroscopy Investigations / Fouad M. Aliev |
| The Structure and Electrical Properties of Polyaniline / Runqing Ou ; Robert J. Samuels |
| Relation Between Heat-Treatment Temperature and Characteristics of Polyparaphenylene(PPP)-Based Carbon Materials for Lithium Ion Secondary Batteries / Kozo Osawa ; Tatsuo Nakazawa ; Kyoich Oshida ; Morinobu Endo ; Mildred S. Dresselhaus |
| Structure and Electronic Properties of Diamond-Like Carbon and its Heat-Treatment Effect / Kazuyuki Takai ; Meigo Oga ; Hirohiko Sato ; Toshiaki Enoki ; Yoshimasa Ohki ; Akira Taomoto ; Kazutomo Suenaga ; Sumio Iijima |
| Author Index |
| Subject Index |
| Preface |
| Materials Research Society Symposium Proceedings |
| Electrically Inhomogeneous Materials |
| Electrical Characterization of Inhomogeneous and Heterogeneous Systems With Microstructural Periodicity / Joachim Maier |
| Effects of Grain Size Distribution on Cole-Cole Plots of Polycrystalline Spinels / M.P. Gutierrez-Amador ; R. Valenzuela |
| Microstructural Development and Properties of (1-x) wt% Ba[subscript 0.55]Sr[subscript 0.45]TiO[subscript 3]-x wt% MgO Bulk Ferroelectrics / Costas G. Fountzoulas |
