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Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California / Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2000
形態:
ix, 396 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3966 <BA0022700X>
著者名:
ISBN:
9780819435842 [0819435848]
書誌ID:
BA60700263
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