Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California | 東京工業大学附属図書館蔵書検索

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Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California / Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2000

形態:

ix, 396 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3966 <BA0022700X>

著者名:

ISBN:

9780819435842 [0819435848]

書誌ID:

BA60700263

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Computer vision--Industrial applications--Congresses; Engineering inspection--Automation--Congresses; Mensuration--Congresses; Quality control--Optical methods--Automation--Congresses
言語:	英語

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