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Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA / Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2001
形態:
vii, 296 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4189 <BA0022700X>
著者名:
ISBN:
9780819438546 [0819438545]
書誌ID:
BA60719308
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