Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA | 東京工業大学附属図書館蔵書検索

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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA / Aland K. Chin ... [et al.] chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2002

形態:

viii, 180 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4648 <BA0022700X>

著者名:

Society of Photo-optical Instrumentation Engineers <DA00848546>

Herrick, Robert W.

Linden, Kurt J.

McGraw, Daniel J.

さらに 1 件

ISBN:

9780819443878 [0819443875]

書誌ID:

BA6213427X

子書誌情報

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ISSN:	0277786X
言語:	英語

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