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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA / Aland K. Chin ... [et al.] chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2002
形態:
viii, 180 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4648 <BA0022700X>
著者名:
Society of Photo-optical Instrumentation Engineers <DA00848546>
Chin, Aland K.
Dutta, Niloy K
Herrick, Robert W.
Linden, Kurt J.
McGraw, Daniel J.
さらに 1 件
ISBN:
9780819443878 [0819443875]
書誌ID:
BA6213427X
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