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2003 IEEE International Reliability Physics Symposium proceedings : 41st annual, Dallas, Texas, March 30-Apri 4, 2003 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

資料種別:
図書
出版情報:
Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002 , c2003
形態:
x, 645 p. ; 28 cm
著者名:
ISBN:
9780780376496 [0780376498] (: soft.)
書誌ID:
BA6271753X
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