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ICMTS 2003, proceedings of the 2003 IEEE International Conference on Microelectronic Test Structures, Double Tree Hotel, Monterey, California, March 17-20, 2003 / sponsored by the IEEE Electron Devices Society

資料種別:
図書
出版情報:
[New York] : Institute of Electrical and Electronics Engineers, c2003
形態:
249 p. ; 28 cm
著者名:
ISBN:
9780780376533 [0780376536]
書誌ID:
BA6271788X
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