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Proceedings, 21st IEEE VLSI Test Symposium (VTS 2003) : 27 April-1 May 2003, Napa Valley, California / sponsored by IEEE Computer Society Test Technology Technical Council

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2003
形態:
xxvii, 432 p. ; 28 cm
著者名:
ISBN:
9780769519241 [0769519245]
書誌ID:
BA62803518
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