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Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA / Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2003
形態:
viii, 322 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v.5092 <BA0022700X>
著者名:
Murrer, Rovert Lee  
ISBN:
9780819449528 [0819449520]
書誌ID:
BA64197135
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