Near-field microscopy and near-field optics

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Near-field microscopy and near-field optics / D. Courjon

資料種別:: 図書
出版情報:: London : Imperial College Press, c2003
形態:: xxi, 317 p ; 24 cm.
著者名:: Courjon, Daniel <DA07730293>
ISBN:: 9781860942587 [186094258X]
書誌ID:: BA64758039

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主題:

分光学．スペクトル

言語:

英語

目次情報:

Preface

How to read this book

History of Near-field Optics / Chapter 1：

Notion of imaging system / 1.1：

Bases of imaging / 1.2：

Vision / 1.2.1：

Image / 1.2.2：

Far-field imaging systems / 1.2.3：

Notion of superresolution / 1.2.4：

Near-field imaging systems / 1.2.5：

History of near-field microscopy / 1.3：

Synge's speculation / 1.3.1：

J. O'Keefe's letter / 1.3.2：

E. Ash and G. Nicholls realization / 1.3.3：

Superresolution in imaging systems / 1.3.4：

Scanning tunnelling microscopy / 1.3.5：

Early optical near-field microscopes / 1.3.6：

Non-radiating Sources & Non-propagating Fields / Chapter 2：

Introduction / 2.1：

A few words of terminology / 2.1.1：

Various non-radiating sources / 2.2：

Non-radiating classical distributions / 2.3：

Non-radiating sources by destructive interference / 2.4：

Extension of the notion of non-radiating source / 2.5：

Evanescent fields / 2.5.1：

Evanescent field generated by total internal reflection / 2.5.2：

Destructive-interference device / 2.5.3：

Resonant evanescent fields / 2.5.4：

Resonant spherical devices / 2.5.5：

Evanescent Optics / Chapter 3：

Theory of Fresnel evanescent waves / 3.1：

Reflection and refraction laws / 3.1.1：

Total internal reflection / 3.1.2：

Energy flow and Poynting vector / 3.1.3：

Goos-Hanchen and transversal shifts / 3.1.4：

Evanescent fields generated by sub-wavelength diffraction / 3.2：

Light beam propagation / 3.3：

A particular case of evanescent waves: the plasmons / 3.4：

Definition of a plasmon / 3.4.1：

Theory / 3.4.2：

Scanning plasmon optical microscopy / 3.4.3：

Theories and Modellings / Chapter 4：

Early works / 4.1：

Recent works / 4.2：

Different ways of approaching the theory of near-field optics / 4.3：

Physical approach / 4.3.1：

Model space / 4.3.2：

Global or non-global approach / 4.3.3：

Tip description / 4.4：

Description in a non-global scheme / 4.4.1：

Description in a global scheme / 4.4.2：

Light-sample interaction / 4.5：

Rigorous grating theory / 4.5.1：

The reciprocal-space perturbative method (RSPM) / 4.5.2：

Direct-space-global approaches / 4.5.3：

Inverse Problem and Apparatus Function / Chapter 5：

Inverse problem solution in band-limited far-field imaging / 5.1：

Inverse propagator and reciprocity theorem / 5.3：

Reciprocity theorem / 5.3.1：

Inverse problem solution in near-field imaging / 5.4：

Apparatus functions / 5.5：

Impulse response / 5.5.1：

Transfer function / 5.5.2：

Criteria of Quality, Noise and Artifacts / Chapter 6：

Degrees of freedom of an optical system / 6.1：

Generalization of Lukosz's approach / 6.1.1：

Far-field case / 6.1.2：

Near-field case / 6.1.3：

Information capacity for noisy coherent signals / 6.1.4：

Noise in optical systems / 6.2：

Optical noises / 6.2.1：

External noises / 6.2.2：

Artifacts / 6.3：

Scanning modes in near-field microscopy / 6.3.1：

Notion of artifact / 6.3.2：

Comparison between the three scanning mode behaviours / 6.4：

Input parameters of the simulation / 6.4.1：

Constant distance mode / 6.4.2：

Constant height mode / 6.4.3：

Constant intensity mode / 6.4.4：

Notion of resolution / 6.5：

Detection / 6.5.1：

Localization / 6.5.2：

Resolution / 6.5.3：

The two-point criterion / 6.5.4：

Other estimates of resolution / 6.5.5：

Optical transfer function OTF / 6.5.6：

OTF in near-field optics / 6.5.7：

Experimental OTF in near-field optics / 6.5.8：

Contrast / 6.5.9：

New criteria of quality / 6.5.10：

Nano-collectors and Nano-emitters / Chapter 7：

Precursors / 7.1：

Near-field collection and emission / 7.2：

Principle / 7.2.1：

Distance of collection/emission / 7.2.2：

Shape of nano-collectors/emitters / 7.2.3：

Various technologies / 7.3：

Bare tapers / 7.4：

Shaping techniques / 7.4.1：

Etching techniques / 7.4.2：

Effect of parameters / 7.4.3：

More sophisticated procedures / 7.4.4：

High aperture angle conical tips / 7.4.5：

Hot stretching techniques / 7.4.6：

Advantages and drawbacks of the two techniques / 7.4.7：

Tapered metal wire and silicon AFM tips / 7.4.8：

Pyramidal tips / 7.4.9：

Coated materials / 7.5：

Flat nano-apertures / 7.5.1：

Tapered nano-apertures / 7.5.2：

Tapered/cleaved fibres / 7.5.3：

Efficiency of tapered metal coated fibres / 7.5.4：

Laser damages / 7.5.5：

Realization of the aperture by other techniques / 7.5.6：

Nano-antenna used as a near-field perturbing system / 7.6：

Variant of tapered fibres / 7.7：

Chemical sensors used as fluorescent tips / 7.8：

Instrumentation / Chapter 8：

Basic structure of near-field optical microscopes / 8.1：

Mechanical part / 8.2：

Translation stage / 8.2.1：

Practical case / 8.2.2：

Techniques for machining the piezo-electric tube / 8.2.3：

Compensation of the thermal drift / 8.2.4：

Connection of the wires on the electrodes / 8.2.5：

Holding of the nano-collector/emitter / 8.3：

Fibre as a nano-collector/emitter / 8.3.1：

Other collector/emitters / 8.3.2：

Anti-vibration devices / 8.4：

Distance control / 8.4.1：

Optical part / 8.5：

Source / 8.5.1：

Detector / 8.5.2：

Usual optical and opto-electronic components / 8.5.3：

Electronic stages / 8.6：

Synchronous detection / 8.6.1：

Distance control: the P.I.D. device / 8.6.2：

Main Near-field Microscope Configurations / Chapter 9：

Transmission microscopes / 9.1：

Reflection microscopy / 9.2：

Tunnelling microscopy / 9.3：

Optical tunnelling microscopy / 9.4：

Plasmon microscopy / 9.5：

Hybrid techniques / 9.6：

Near-field microscopy with shear-force control / 9.6.1：

Contact near-field optical microscopy / 9.6.2：

Near-field Image Processing / Chapter 10：

Generalities / 10.1：

Linear distortions / 10.1.1：

Non-linear distortions / 10.1.2：

Correction of distortions / 10.2：

Correction of linear distortions / 10.2.1：

Correction of non-linear distortions / 10.2.2：

Correction of tip-sample sticking / 10.2.3：

Filtering process / 10.3：

Direct or local filtering / 10.3.1：

Fourier or reciprocal filtering / 10.3.2：

Karhunen-Loeve transform and information extraction / 10.4：

Applications of Near-field Microscopy / Chapter 11：

First attempts: topography measurements / 11.1：

Local index variation measurement / 11.1.2：

Light trapping / 11.2：

Concept of nano-optics / 11.3：

A simple case: the frustrated reflection by a sphere or a tip / 11.4：

A second example: the resonant tunnelling effect / 11.5：

A more sophisticated example: a sub-wavelength periodic structure / 11.6：

Photonic transfer through segmented optical waveguides / 11.7：

Basis of Optics / Appendix A：

Unit Systems / A.0.1：

Basic functions and operators in optics / A.1：

Reminder on vectorial calculus / A.1.1：

Relations connecting gradient, divergence and rotational / A.1.2：

Dyadic analysis / A.1.3：

Maxwell's equations / A.2：

Material equations / A.2.1：

Maxwell's equation in the dyadic scheme / A.2.2：

Wave equation / A.3：

There is no charges or currents ([characters not reproducible] = 0 and j = 0) / A.3.1：

The medium is homogeneous, ([mu] and [epsilon] space-independent) / A.3.2：

The medium is homogeneous and there is no charges or currents / A.3.3：

Case of harmonic fields / A.3.4：

Scalar and vector potentials / A.4：

Static regimes / A.5：

Poisson's and Laplace's equations / A.5.1：

Field generated by a single charge / A.5.2：

Flux of an electric field through a surface element / A.5.3：

Gauss' theorem / A.5.4：

Green's functions and Green's theorem / A.6：

Green's functions in classical potential theory / A.6.1：

Time dependent fields: the Helmholtz equation / A.6.2：

Green's theorem / A.6.3：

Green's dyadic / A.6.4：

Expansion of a field in term of a set of plane waves / A.7：

Basis / A.7.1：

Angular spectrum expansion (A.S.E.) / A.7.2：

Propagation of light using A.S.E. / A.8：

Analysis of the results / A.9：

Nomenclature

List of Acronyms

Glossary

Index

Author Index

Bibliography

Preface

How to read this book

History of Near-field Optics / Chapter 1：

Notion of imaging system / 1.1：

Bases of imaging / 1.2：

Vision / 1.2.1：

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