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Ninteenth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 11-13, 2003 : SEMI-THRM Proceedings 2003 / [sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST

資料種別:
図書
出版情報:
Piscataway, N.J. : IEEE Service Center, c2003
形態:
xiii, 404 p. ; 28 cm
著者名:
ISBN:
9780780377936 [0780377931]
書誌ID:
BA65904158
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