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2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

資料種別:
図書
出版情報:
Piscataway, N.J. : IEEE Operations Center, c2002
形態:
v, 214 p. ; 28 cm
著者名:
ISBN:
9780780375581 [0780375580] (:softbound)
書誌ID:
BA66524709
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