Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003 / edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore
- 資料種別:
- 図書
- 出版情報:
- Piscataway, N.J. : IEEE Operations Center, c2003
- 形態:
- 216 p. ; 30 cm
- 著者名:
- ISBN:
- 9780780377226 [0780377222]
- 書誌ID:
- BA66599934
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