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Proceedings, 22nd IEEE VLSI Test Symposium : 25-29 April 2004, Napa Valley, California / sponsored by IEEE Computer Society Test Technology Technical Council

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2004
形態:
xxvii, 406 p. ; 28 cm
著者名:
ISBN:
9780769521343 [0769521347]
書誌ID:
BA67539723
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