Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 9-11, 2004 : proceedings 2004 | 東京工業大学附属図書館蔵書検索

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Twentieth annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA USA, March 9-11, 2004 : proceedings 2004 / [sponsored by] IEEE, Components, Packaging, and Manufacturing Technology Society, NIST

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図書

出版情報:

Piscataway, N.J. : IEEE Service Center, c2004

形態:

xiii, 313 p. ; 28 cm

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ISBN:

9780780383630 [078038363X]

書誌ID:

BA69519421

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書誌詳細

ISSN:	10652221
注記:	Title from cover "IEEE catalog number 04CH37545" -- T.p. verso Symposium held at: Fiarmont Hotel, San Jose, CA, USA
言語:	英語

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